See what other methods leave hidden – with high-resolution electron microscopy and customized analysis packages at the IFW Dresden.
The IFW Dresden offers comprehensive electron microscopy services (SEM & TEM) for high-resolution structural analysis of a wide variety of materials. Our equipment enables not only conventional imaging but also combined analyses using energy-dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS/ELNES). In situ experiments provide additional insights into dynamic structural changes under real-world conditions. Through in-house sample preparation – including thin-film deposition – we handle complete material analysis from a single source.
Your benefits
- Imaging down to the sub-nanometer range
- Combined structural and chemical analysis for precise material characterization
- In-situ experiments under realistic operating conditions
- Complete on-site sample preparation for fast results
- Wide range of materials from metals to ceramics to nanostructures
Methods
- Scanning electron microscopy (SEM) and transmission electron microscopy (TEM)
- EDXS for elemental analysis
- EELS/ELNES for electronic structure investigations
- In-situ heating and loading experiments
- Thin film deposition and preparation for material and multilayers
Fields of application
- Quality control and damage analysis
- Development and optimization of functional layers
- Characterization of nanostructures (e.g. graphene, CNTs)
- Analysis of multilayer systems with special magnetic or electronic properties
- Investigation of thin protective and functional layers
